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The AAPG/Datapages Combined Publications Database

Journal of Sedimentary Research (SEPM)


Journal of Sedimentary Petrology
Vol. 43 (1973)No. 2. (June), Pages 540-543

An X-ray Technique for Distinguishing Between Detrital and Secondary Quartz in the Fine-grained Fraction of Sedimentary Rocks

Eric V. Eslinger (3), Lawrence M. Mayer (4), Thomas L. Durst, John Hower, Samuel M. Savin


Fine-grained disseminated quartz in sedimentary rocks may often be characterized as being secondary in origin on the basis of its X-ray diffractogram. The existence of a diffractogram intensity ratio I100/I101 substantially greater than that obtained Previous HitfromNext Hit a random sample of crushed quartz appears to be a sufficient (but not necessary) criterion for recognizing quartz of secondary origin in the absence of a volcanic component. The intensity ratio anomaly reflects preferred orientation of quartz in the sample mount and results Previous HitfromNext Hit the presence of faces on the (100) form (prism face) on some of the grains. These results are consistent with both geologic and oxygen isotopic evidence.

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