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The AAPG/Datapages Combined Publications Database
Journal of Sedimentary Research (SEPM)
Abstract
Relation of Textural (CM) Patterns to Depositional Environment of Alluvial-fan Deposits
William B. Bull
ABSTRACT
Logarithmic plots of the coarsest 1-percentile grain size (C) and the median grain size (M) of alluvial-fan deposits make distinctive patterns for samples from western Fresno County, Calif. The CM pattern for the tractive-current sediments parallels the limiting line C = M and swings upward where C is about 1500 microns. The mudflow CM pattern is rectilinear and approximately parallels the line C = M. C is about 40 to 80 times M along the axis of the mudflow pattern.
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