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The AAPG/Datapages Combined Publications Database

Journal of Sedimentary Research (SEPM)


Journal of Sedimentary Petrology
Vol. 39 (1969)No. 4. (December), Pages 1384-1389

X-Ray Diffraction Analysis of Heavy Minerals

W. A. Pryor, N. C. Hester (2)


Techniques have been developed which yield reproducible results for X-ray diffraction analysis of heavy mineral samples. Uniformity of grinding, orientation of mounted mineral particles, mass absorption fluorescence, and textural character of heavy mineral grains are the important, influential variables whose effects on X-ray diffraction analysis of heavy minerals have been determined and minimized. Heavy mineral samples can be grouped according to their gross diffraction patterns or diffraction "finger prints," which correspond to petrographic groups. X-ray diffraction analysis can be used as a routine, rapid, and supplementary method for analyzing large numbers of heavy mineral samples.

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