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The AAPG/Datapages Combined Publications Database

Journal of Sedimentary Research (SEPM)


Journal of Sedimentary Petrology
Vol. 39 (1969)No. 4. (December), Pages 1596-1597

Authigenic Mineral Growths as Revealed by the Scanning Electron Microscope: NOTES

Roger L. Borst, Robert Q. Gregg


A paragenetic sequence of three authigenic minerals has been photographed in a fine-grained sandstone using the scanning electron microscope (SEM). The instrument used in these studies is the Stereoscan, manufactured by Cambridge Instrument Company. The SEM is superior to the transmission electron microscope for revealing delicate authigenic minerals. The electron micrographs illustrate the value of the SEM in studying micro-features of sedimentary rocks and point out the continuing need for supplementary mineralogical data.

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