The Advanced Instrumentation Laboratory (AIL) is pleased to announce the acquisition of an Axios wavelength dispersive XRF manufactured by PANalytical (a spinoff of Philips). Funding was provided by the Volcano Hazards Program of the US Geological Survey and AIL.

The Axios has a 4-kilowatt tube and is equipped with crystals allowing it to analyze elements from O to U quantitatively, and down to C semi-quantitatively. Depending on the matrix, trace elements can be measured at levels less than 1 ppm.

The Axios can provide rapid semi-quantitative analyses of samples: A 50 second scan provides major oxide data and traces at approximately 100ppm, a 15 minute scan lowers detection limits to approximately 10 ppm. The semi-quantitative analyses are fairly independent of sample type, although the more known about the sample, the better the results.

Sample types that can be analyzed include pressed powders (typically used for transition and rare earth element traces), glass beads (typically used for major oxides), and because of its helium atmosphere accessory, loose powders and liquids as well. We are attempting to standardize on 40mm diameter samples although other sizes can be accommodated. In its current configuration some 20 samples can be queued for analysis, with some additions this number could be expanded to over 100.

As part of the package, we purchased a semi-automatic Claisse M-4 fluxer for the preparation of glass beads. It can also be used to dissolve powders into fluxes and then poured into acid solutions for subsequent ICP-MS analysis.

For more information on capabilities, availabilities, rates, or a demonstration, contact the author.