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The AAPG/Datapages Combined Publications Database
Journal of Sedimentary Research (SEPM)
Abstract
Grain Size Measurement in Thin Section and in Grain Mount: NOTES
Richard E. Smith
ABSTRACT
Statistical analysis of quartz grain size measurements performed in thin section and by grain mount techniques indicates that the thin section technique underestimates true grain size by a constant amount where "true" grain size is represented by the grain mount measurements. Variation in the long (a) and short (b) axes using either technique contains about 98 percent in common. When the "a" axis in thin section is compared with the "a" axis in grain mount, 43 percent of the variability is common; the remaining 57 percent is attributed to the effect
of fabric (orientation and packing) and "error" sources of variation.
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